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Investigation of the structure of damage layers in TEM samples prepared using a focused ion beam

✍ Scribed by S. Rubanov; P. R. Munroe

Book ID: 110295957
Publisher: Springer
Year: 2001
Tongue: English
Weight: 133 KB
Volume: 20
Category: Article
ISSN: 0261-8028
DOI: 10.1023/a:1010950201525

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