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Investigation of the structural features of the surface of amorphous varieties of silicas by x-ray photoelectron spectroscopy and measurement of the shifts of the Kα1-radiation line of silicon

✍ Scribed by V. N. Pak; Yu. P. Kostikov

Publisher: Springer US
Year: 1977
Tongue: English
Weight: 278 KB
Volume: 26
Category: Article
ISSN: 0021-9037
DOI: 10.1007/bf00606966

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