✍ Scribed by J.K. Gimzewski; S. Vepřek
No coin nor oath required. For personal study only.
📜 SIMILAR VOLUMES
## Silicon with thermally-grown oxide overlayers m the thickness range IS-89 A IS studied by angulardcpendent XPS. Electron attenuation lengths at 1382 eV are found to be 37 +-4 A in SiOz and 27 +-6 A in Si. Single-crystal effects and thin-layer anomalies are also discussed.
Three-way parallel factor analysis (PARAFAC) has been used to decompose several series of XPS O 1s spectra obtained in the study of oxidation of aluminium by water vapour. Reaction time, reactant pressure and binding energy in the XPS spectrum are the independent variables. Four factors have been ex
Three-way parallel factor analysis (PARAFAC) has been used to decompose a set of x-ray photoelectron spectroscopy (XPS) spectra that result during the oxidation of aluminium surfaces. The Al 2p core-level photoelectron lines have been used to follow oxide Ðlm growth on clean aluminium surfaces as a