Investigation of the initial stages of oxidation of microcrystalline silicon by means of X-ray photoelectron spectroscopy : J. K. Gimzewski and S. Veprek. Solid St. Commun.47 (9) 747 (1983)

• Publisher: Elsevier Science
• Year: 1984
• Tongue: English
• Weight: 131 KB
• Volume: 24
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(84)90594-8