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Investigation of the Si(100)2 × 1/Cu interface by UPS and surface reflectance spectroscopy

✍ Scribed by S. Guillet; L.E. Regalado; T. Lopez-Rios; R. Cinti

Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
304 KB
Volume
65-66
Category
Article
ISSN
0169-4332

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