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Investigation of the relative density of deep defects in Cu(In,Ga)Se 2 thin films dependent on Ga content by transient photocapacitance method

✍ Scribed by Hu, Xiaobo; Sakurai, Takeaki; Yamada, Akimasa; Ishizuka, Shogo; Niki, Shigeru; Akimoto, Katsuhiro

Book ID: 123618622
Publisher: Institute of Pure and Applied Physics
Year: 2014
Tongue: English
Weight: 390 KB
Volume: 53
Category: Article
ISSN: 0021-4922
DOI: 10.7567/JJAP.53.068008

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