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Investigation of deep-level defects in Cu(In,Ga)Se2 thin films by two-wavelength excitation photo-capacitance spectroscopy

✍ Scribed by Hu, Xiaobo; Gupta, Amit; Sakurai, Takeaki; Yamada, Akimasa; Ishizuka, Shogo; Niki, Shigeru; Akimoto, Katsuhiro

Book ID: 121706792
Publisher: American Institute of Physics
Year: 2013
Tongue: English
Weight: 814 KB
Volume: 103
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.4826144

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