Residual stress in epoxy resin cured on A1 plate was investigated by X-ray diffraction. Microdeformation of A1 crystal can be detected as a shift of X-ray diffraction peak induced by the stress resided. Results show that A1 plate is subjected to a uniaxial compressive stress of 29 MPa parallel to th
Investigation of the phase composition of six dental amalgams by X-ray diffraction
✍ Scribed by Vrijhoef, M. M. A. ;Driessens, F. C. M.
- Publisher
- John Wiley and Sons
- Year
- 1974
- Tongue
- English
- Weight
- 309 KB
- Volume
- 8
- Category
- Article
- ISSN
- 0021-9304
No coin nor oath required. For personal study only.
✦ Synopsis
The integrated intensities of certain reflections of the 7 , yl, and y2 phase have been determined as a function of the mercury content of 6 amalgams after annealing for 20 hr at 37°C. This dependency could be described satisfactorily by means of the regression model:
Here I , is the integrated peak intensity for phase i a t a mercury fraction of W by weight, whereas I,o and a, are constants of the material, whereby i = 0, 1 , 2 stands for the y, y,, and y2 phase respectively. Considerable differences between the 01% and I t o parameters of the different amalgams were detected.
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