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Change of the X-Ray Polarisation State by Diffraction

✍ Scribed by H.-R. Höche; M. Kolbe; Ch. Eisenschmidt


Publisher
John Wiley and Sons
Year
2002
Tongue
English
Weight
489 KB
Volume
37
Category
Article
ISSN
0232-1300

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Residual stress in epoxy resin cured on A1 plate was investigated by X-ray diffraction. Microdeformation of A1 crystal can be detected as a shift of X-ray diffraction peak induced by the stress resided. Results show that A1 plate is subjected to a uniaxial compressive stress of 29 MPa parallel to th