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Investigation of subgap structures in high-quality Nb/AlOx/Nb tunnel junctions

โœ Scribed by Cristiano, R.; Frunzio, L.; Monaco, R.; Nappi, C.; Pagano, S.


Book ID
115450172
Publisher
The American Physical Society
Year
1994
Tongue
English
Weight
637 KB
Volume
49
Category
Article
ISSN
1098-0121

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โœ R. Cristiano; L. Frunzio; R. Monaco; C. Nappi; S. Pagano ๐Ÿ“‚ Article ๐Ÿ“… 1994 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 126 KB

We have investigated both theoretically and experimentally the two-particle structures, which appear at low temperature in high quality Nb/A1Ox/Nb Josephson tunnel junctions in the subgap region of the current-voltage characteristics. We performed measurements on low Josephson critical current densi

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~urrent -voltage measurements on high conductance Nb/AIOx/AI/AIOx/Nb tunnel junction devices show a step In the sub-gap structure corresponding to the difference in the energy gaps V=2(!lNb-!lAI) of the two sup~.rcC?nduct~.rs. The measured !lAI is large. a~d'persists to temperature considerably in e