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Investigation of quantitative secondary electron imaging of semiconducting polymer materials using environmental scanning electron microscopy

✍ Scribed by S. J. WILLIAMS; A. M. DONALD

Book ID: 110735974
Publisher: John Wiley and Sons
Year: 2004
Tongue: English
Weight: 226 KB
Volume: 216
Category: Article
ISSN: 0022-2720
DOI: 10.1111/j.0022-2720.2004.01417.x

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