𝔖 Bobbio Scriptorium

✦ LIBER ✦

Nondestructive imaging and characterizations of electronic materials and devices using scanning acoustic microscopy : Tsai, C.S.; Lee, C.C. An International Symposium on Pattern Recognition and Acoustical Imaging, Newport Beach, California (United States), 4–6 Feb. 1987. pp. 260–266. Proceedings of the SPIE — The International Society for Optical Engineering, Vol. 768 (1987)

Publisher: Elsevier Science
Year: 1990
Weight: 170 KB
Volume: 23
Category: Article
ISSN: 0308-9126
DOI: 10.1016/0308-9126(90)91513-s

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