Investigation of metal-semiconductor interface states by constant emission rate and constant capture rate capacitance spectroscopies

✍ Scribed by P. Muret; A. Deneuville

• Book ID: 118361678
• Publisher: Elsevier Science
• Year: 1986
• Tongue: English
• Weight: 327 KB
• Volume: 168
• Category: Article
• ISSN: 0039-6028
• DOI: 10.1016/0039-6028(86)90916-7