Constant emission rate and constant capture rate capacitance spectroscopies applied to the determination of the properties of the states localized at Ag/Si and Au/Si interfaces

✍ Scribed by P. Muret; A. Deneuville

• Book ID: 118986604
• Publisher: Elsevier Science
• Year: 1985
• Tongue: English
• Weight: 192 KB
• Volume: 162
• Category: Article
• ISSN: 0039-6028
• DOI: 10.1016/0039-6028(85)90960-4