Investigation of metal-semiconductor interface states by constant emission rate and constant capture rate capacitance spectroscopies

✍ Scribed by P. Muret; A. Deneuville

• Publisher: Elsevier Science
• Year: 1986
• Weight: 43 KB
• Volume: 168
• Category: Article
• ISSN: 0167-2584
• DOI: 10.1016/0167-2584(86)90506-2