Investigation of Interfacial Reactions in Bimetallic Thin-Film Couples of Al/Cu and Pb/Cu by Measurement of Contact Resistance

✍ Scribed by Shearer, M. P. ;Sen, S. K. ;Bauer, C. L.

• Publisher: John Wiley and Sons
• Year: 1982
• Tongue: English
• Weight: 805 KB
• Volume: 69
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.2210690112