Investigation of interfacial reactions in monocrystalline and polycrystalline thin film couples of gold and silver by Auger depth profiling, transmission electron microscopy and measurement of contact resistance

✍ Scribed by S.K. Sen; P.M. Kluge-Weiss; C.L. Bauer

• Publisher: Elsevier Science
• Year: 1981
• Tongue: English
• Weight: 926 KB
• Volume: 82
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/0040-6090(81)90473-9