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Investigation of electrical properties of HfO2metal–insulator–metal (MIM) devices

✍ Scribed by Khaldi, O.; Jomni, F.; Gonon, P.; Mannequin, C.; Yangui, B.

Book ID: 121553852
Publisher: Springer
Year: 2014
Tongue: English
Weight: 615 KB
Volume: 116
Category: Article
ISSN: 1432-0630
DOI: 10.1007/s00339-014-8292-8

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