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Investigation of dislocations and defects in epitaxial lateral overgrown GaN by photoelectrochemical wet etching

✍ Scribed by F. Wang; R. Zhang; X.Q. Xiu; K.L. Chen; S.L. Gu; B. Shen; Y.D. Zheng; T.F. Kuech

Book ID: 117357240
Publisher: Elsevier Science
Year: 2003
Tongue: English
Weight: 171 KB
Volume: 57
Category: Article
ISSN: 0167-577X
DOI: 10.1016/s0167-577x(02)00988-6

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