Investigation of tetrahedral amorphous c
Investigation of tetrahedral amorphous carbon films using x-ray photoelectron and Raman spectroscopy
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Tay, B. K.; Shi, X.; Tan, H. S.; Chua, Daniel H. C.
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Article
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1999
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John Wiley and Sons
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English
⚖ 142 KB
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Amorphous carbon containing very little hydrogen and having a highly tetrahedral structure has been prepared by the Filtered Cathodic Vacuum Arc (FCVA) technique under different deposition temperatures. Based on Raman measurement, it was found that the I D =I G intensity ratio, the G band peak posit