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Investigation of capacitance–voltage characteristics in Ge /high-κ MOS devices

✍ Scribed by M. Moreau; D. Munteanu; J.-L. Autran; F. Bellenger; J. Mitard; M. Houssa


Book ID
116671676
Publisher
Elsevier Science
Year
2009
Tongue
English
Weight
357 KB
Volume
355
Category
Article
ISSN
0022-3093

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