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Investigation into the correlation factor of substrate and multilayer film surfaces by atomic force microscopy

✍ Scribed by J. V. Grishchenko, M. L. Zanaveskin

Book ID
120803737
Publisher
SP MAIK Nauka/Interperiodica
Year
2013
Tongue
English
Weight
482 KB
Volume
58
Category
Article
ISSN
1063-7745

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