๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Calculating correlation factor for substrate and film coating profiles according to data of atomic force microscopy

โœ Scribed by Yu. V. Grishchenko, M. L. Zanaveskin, A. N. Marchenkov

Book ID
119884870
Publisher
SP MAIK Nauka/Interperiodica
Year
2012
Tongue
English
Weight
146 KB
Volume
38
Category
Article
ISSN
1063-7850

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Oxygen interaction of CdS-based gas sens
Oxygen interaction of CdS-based gas sensors with different stoichiometric compositions was studied by X-ray photoelectron spectroscopy (XPS) and thermal-desorption mass spectroscopy observations combined with conductivity measurements. Three different types of film with different atomic ratios of Cd/S were used in the study of oxygen chemisorption in a low-temperature range between 300 and 570 K. Spray pyrolysis was used for the deposition of the films on glass substrates; XPS and energy dispersive spectroscopy of X-ray together with atomic force microscopy and scanning electron microscopy were used for the characterization of the composition and structure of the films. It was possible to distinguish different temperature ranges for the thermal desorption of the different adsorbed oxygen species. A comparison of the data from XPS and mass-spectroscopy observations with conductance measurements allows to conclude that metallic surface atoms are responsible for different interactions of oxygen species with CdS surfaces.
๐Ÿ“‚ Article ๐Ÿ“… 1995 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 379 KB