𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Investigation and modeling of impact ionization with regard to the RF and noise behavior of HFET

✍ Scribed by Reuter, R.; Agethen, M.; Auer, U.; van Waasen, S.; Peters, D.; Brockerhoff, W.; Tegude, F.-J.


Book ID
114552998
Publisher
IEEE
Year
1997
Tongue
English
Weight
262 KB
Volume
45
Category
Article
ISSN
0018-9480

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES