Intrinsic stress in thin films of Ag, Al, ZnS and LiF
โ Scribed by M. Laugier
- Publisher
- Springer
- Year
- 1980
- Tongue
- English
- Weight
- 484 KB
- Volume
- 15
- Category
- Article
- ISSN
- 0022-2461
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๐ SIMILAR VOLUMES
The formation of grains in thin films generates intrinsic residual stress. In this work, we present a model of intrinsic residual stress calculation based on the size-dependent phase transitions of the nanograins. Evaporated thin films are produced by condensation from the vapor on the substrate. It
Cr, Ti, Hf, Zr, Co, Ta, I'd, and Pt. The AI-Cr system was investigated in some detail using a conductance method and nuclear backscattering for reaction-rate measurements. The compounds CrAl, and Cr2AI,, were identified and their growth was found to be diffusion controlled. The temperature dependenc