Interstitial Carbon Related Defects in Low-Temperature Irradiated Si: FTIR and DLTS Studies

✍ Scribed by Khirunenko, L.I.; Pomozov, Yu.V.; Tripachko, N.A.; Sosnin, M.G.; Duvanskii, A.; Murin, L.I.; Lindström, J. Lennart; Lastovskii, S.B.; Makarenko, L.F.; Markevich, V.P; Peaker, A.R.

• Book ID: 121349666
• Publisher: Trans Tech Publications, Ltd.
• Year: 2005
• Tongue: English
• Weight: 327 KB
• Volume: 108-109
• Category: Article
• ISSN: 1662-9779
• DOI: 10.4028/www.scientific.net/SSP.108-109.261