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On-line DLTS investigations of vacancy related defects in low-temperature electron irradiated, boron-doped Si

โœ Scribed by N.R. Zangenberg; A. Nylandsted Larsen


Book ID
106019065
Publisher
Springer
Year
2005
Tongue
English
Weight
399 KB
Volume
80
Category
Article
ISSN
1432-0630

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