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Interrelation between surface states and transition layer defects in Si-SiO2 structures

✍ Scribed by V.S. Lysenko; T.N. Sytenko; O.V. Snitko; V.I. Zimenko; A.N. Nazarov; I.N. Osiyuk; T.E. Rudenko; I.P. Tyagulskii

No coin nor oath required. For personal study only.

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