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Radiation induced interface states and ESR evidence for room temperature interactions between molecular hydrogen and silicon dangling bonds in amorphous SiO2 Films on Si

✍ Scribed by J.F. Conley; P.M. Lenahan


Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
400 KB
Volume
22
Category
Article
ISSN
0167-9317

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