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Interrelation between nanostructure and optical properties of oxide thin films by spectroscopic ellipsometry

✍ Scribed by M. Losurdo; D. Barreca; P. Capezzuto; G. Bruno; E. Tondello

Book ID
108423002
Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
531 KB
Volume
151-152
Category
Article
ISSN
0257-8972

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Spectroscopic ellipsometry has been used to determine the optical constants-complex dielectric constant (e\* = e 1 + e 2 ), refractive index (n), extinction coefficient (k), absorption coefficient (a) and normal incidence reflectivity (R)-of two-source vacuum-evaporated polycrystalline Cd 1 Γ€x Zn x