Interpretation of non-equilibrium measurements on MOS devices using the linear voltage ramp technique: L. Faraone, J. G. Simmons and Anant K. Agarwal. Solid-St. Electronics 24 (8) 709 (1981)

• Book ID: 107829418
• Publisher: Elsevier Science
• Year: 1982
• Tongue: English
• Weight: 111 KB
• Volume: 22
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(82)90147-0