Interpretation of non-equilibrium measurements on MOS devices using the linear voltage ramp technique

✍ Scribed by L. Faraone; J.G. Simmons; Anant K. Agarwal; P.D. Tonner

• Publisher: Elsevier Science
• Year: 1981
• Tongue: English
• Weight: 779 KB
• Volume: 24
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(81)90050-2