Interpretation of non-equilibium measurements on MOS devices using the linear voltage ramp technique: L. Faraone, J. G. Simmons and Anant K. Agarwal Solid-St. Electron. 24(8) 709 (1981)

• Book ID: 104157066
• Publisher: Elsevier Science
• Year: 1983
• Tongue: English
• Weight: 101 KB
• Volume: 14
• Category: Article
• ISSN: 0026-2692
• DOI: 10.1016/s0026-2692(83)80184-0