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Interpretation of C-V measurements for determining the doping profile in semiconductors

✍ Scribed by G. Baccarani; M. Rudan; G. Spadini; H. Maes; W. Vandervorst; R. Van Overstraeten


Publisher
Elsevier Science
Year
1980
Tongue
English
Weight
657 KB
Volume
23
Category
Article
ISSN
0038-1101

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