Interpretation of C-V measurements for determining the doping profile in semiconductors: G. Baccarani, M. Rudan, G. Spadini, H. Maes, W. Vandervorst and R. Van Overstraeten. Solid-St. Electron., 23, 65 (1980)

• Publisher: Elsevier Science
• Year: 1980
• Tongue: English
• Weight: 116 KB
• Volume: 20
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(80)90739-8