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Interface traps distribution and temperature-dependent 6H-SiC MOSFET analysis

✍ Scribed by Kaushik, Navneet; Haldar, Subhasis; Gupta, Mridula; Gupta, R S

Book ID: 124076046
Publisher: Institute of Physics
Year: 2005
Tongue: English
Weight: 226 KB
Volume: 21
Category: Article
ISSN: 0268-1242
DOI: 10.1088/0268-1242/21/1/002

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