Interface trap characterization and electrical properties of Au-ZnO nanorod Schottky diodes by conductance and capacitance methods

✍ Scribed by Hussain, I.; Soomro, M. Y.; Bano, N.; Nur, O.; Willander, M.

• Book ID: 115486870
• Publisher: American Institute of Physics
• Year: 2012
• Tongue: English
• Weight: 934 KB
• Volume: 112
• Category: Article
• ISSN: 0021-8979
• DOI: 10.1063/1.4752402