Electrical characterization of Al/MEH-PPV/p-Si Schottky diode by current–voltage and capacitance–voltage methods

✍ Scribed by Mehmet Enver Aydin; Fahrettin Yakuphanoglu; Jae-Hoon Eom; Do-Hoon Hwang

• Publisher: Elsevier Science
• Year: 2007
• Tongue: English
• Weight: 192 KB
• Volume: 387
• Category: Article
• ISSN: 0921-4526
• DOI: 10.1016/j.physb.2006.04.012