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Interface strain study of thin Lu2O3/Si using HRBS

✍ Scribed by T.K. Chan; P. Darmawan; C.S. Ho; P. Malar; P.S. Lee; T. Osipowicz

Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
144 KB
Volume
266
Category
Article
ISSN
0168-583X

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