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Interface states of SiO2/Si(111) observed by an atomic force microscope

✍ Scribed by Ryu Hasunuma; Yasushiro Nishioka; Atsushi Ando; Kazushi Miki

Book ID: 117220150
Publisher: Elsevier Science
Year: 1999
Tongue: English
Weight: 249 KB
Volume: 443
Category: Article
ISSN: 0039-6028
DOI: 10.1016/s0039-6028(99)01023-7

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