✦ LIBER ✦

In situexamination of the chemical etching of SiO2-Si structures using an atomic force microscope

✍ Scribed by A. A. Bukharaev; A. A. Bukharaeva; N. I. Nurgazizov; D. V. Ovchinnikov

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Atomic-force-microscopy visualization of

✍ M. S. Dunaevskii; J. J. Grob; A. G. Zabrodskii; R. Laiho; A. N. Titkov 📂 Article 📅 2004 🏛 Springer 🌐 English ⚖ 256 KB

Phase Detection Used in the Optical-Emis

✍ K. V. Rudenko; Ya. N. Sukhanov; N. I. Bazaev 📂 Article 📅 2003 🏛 Springer 🌐 English ⚖ 45 KB

An evaluation of the use of the atomic f

✍ Sidney R. Cohen 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 525 KB

Direct measurement of forces between sil

✍ Laurence Meagher 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 200 KB

Measuring the Interaction Forces between

✍ N. D. Wangsa-Wirawan; A. Ikai; B. K. O'Neill; A. P. J. Middelberg 📂 Article 📅 2001 🏛 American Institute of Chemical Engineers 🌐 English ⚖ 156 KB

Direct observation of the atomic structu

✍ M. Pasemann; O.P. Pchelyakov 📂 Article 📅 1982 🏛 Elsevier Science 🌐 English ⚖ 167 KB