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An evaluation of the use of the atomic force microscope for studies in nanomechanics

โœ Scribed by Sidney R. Cohen


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
525 KB
Volume
42-44
Category
Article
ISSN
0304-3991

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An atomic force microscope has been used to quantify directly the adhesion between single Aspergillus niger spores and freshly cleaved mica surfaces. The measurements used "spore probes" constructed by immobilizing a single spore at the apex of a tipless AFM cantilever. Adhesion was quantified from