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Interface states and impurities in MOS structures with very thin tunneling barriers

โœ Scribed by P. Balk; L.Do Thanh; S. Ewert; M. Kuball; S. Schmitz


Publisher
Elsevier Science
Year
1987
Tongue
English
Weight
362 KB
Volume
30
Category
Article
ISSN
0169-4332

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