Detection of interface and volume traps in very thin oxide MOS structures using DLTS, quasi-static and conductance measurements

✍ Scribed by D. Bauza; P. Morfouli; G. Pananakakis

• Publisher: Elsevier Science
• Year: 1991
• Tongue: English
• Weight: 308 KB
• Volume: 34
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(91)90210-p