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Interface recombination in heterojunctions of amorphous and crystalline silicon

โœ Scribed by A Froitzheim; K Brendel; L Elstner; W Fuhs; K Kliefoth; M Schmidt

Book ID
117145494
Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
184 KB
Volume
299-302
Category
Article
ISSN
0022-3093

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๐Ÿ“œ SIMILAR VOLUMES

Properties of interfaces in amorphous/cr
Properties of interfaces in amorphous/crystalline silicon heterojunctions
โœ Olibet, Sara ;Vallat-Sauvain, Evelyne ;Fesquet, Luc ;Monachon, Christian ;Hessle ๐Ÿ“‚ Article ๐Ÿ“… 2010 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 852 KB

## Abstract To study recombination at the amorphous/crystalline Si (aโ€Si:H/cโ€Si) heterointerface, the amphoteric nature of silicon (Si) dangling bonds is taken into account. Modeling interface recombination measured on various test structures provides insight into the microscopic passivation mechan