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Interdiffusion studies on high-Tc superconducting YBa2Cu3O7−δ thin films on Si(111) with a NiSi2/ZrO2 buffer layer

✍ Scribed by W.A.M. Aarnink; D.H.A. Blank; D.J. Adelerhof; J. Flokstra; H. Rogalla; A. van Silfhout; R. de Reus

Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
783 KB
Volume
47
Category
Article
ISSN
0169-4332

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Epitaxial CeO2 buffer layers and YBa2Cu307\_~ thin films have been grown in situ on (1].02) sapphire by electron beam evaporation. Buffer layers of only 20 nm thickness inhibit interdiffusion between YBa2 Cu3 O7-6 and A12 03 as determined by depth profiling using x-ray photoelectron spectroscopy. Th