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Structural characteristics of YBa2Cu3O7−δ films on ZrO2 (100) and silicon with a ZrO2 buffer layer

✍ Scribed by W. Shi; J. Shi; W. Yao; Zh. Qi; Sh. Tang; G. Zhou


Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
287 KB
Volume
203
Category
Article
ISSN
0040-6090

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