𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Interdiffusion studies in silver/palladium couples by means of Auger depth profiling

✍ Scribed by Antoni Bukaluk; Mikołaj Rozwadowski

Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
431 KB
Volume
46
Category
Article
ISSN
0042-207X

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

In-depth composition profile of anodic o
In-depth composition profile of anodic oxide films on aluminium studied by auger electron spectroscopy
✍ S. Matsuzawa; N. Baba; S. Tajima 📂 Article 📅 1979 🏛 Elsevier Science 🌐 English ⚖ 286 KB

In-depth composition profiles of the an&c oxide films grown on Al (1 I1 ), (I 10) and (100) single crystal electrodes in ammonium borate were studied by Auger electron spectroscopy with Ar ion etching. The oxide film had the composition of Ai,O, as referenced to an authentic a-Al,O, single crystal.

Study of Low-energy Atomic Mixing by Mea
Study of Low-energy Atomic Mixing by Means of Auger Depth Profiling, XTEM and TRIM Simulation on Ge/Si Multilayer System
✍ Barna, A.; Menyhard, M. 📂 Article 📅 1996 🏛 John Wiley and Sons 🌐 English ⚖ 769 KB

Low-energy atomic mixing is experimentally studied on a Ge/Si amorphous multilayer system by means of Auger depth profiling and XTEM. The ion etching was performed by using Ar ions of energy 500 eV (XTEM) and 618 eV (Auger) and angle of incidence >84" and the specimen was rotated during sputtering.