Auger depth profiling technique and X-ray diffraction analysis have been employed to study the interdiffusion in vacuum-deposited copper-nickel bilayer thin films. An adaptation of the Whipple model was used to determine the diffusion coefficients of both nickel in copper and copper in nickel. The c
✦ LIBER ✦
Interdiffusion of thin bilayers of copper and nickel
✍ Scribed by Ilkka Suni; Marc-A. Nicolet; Martti Mäenpää
- Publisher
- Elsevier Science
- Year
- 1981
- Tongue
- English
- Weight
- 229 KB
- Volume
- 79
- Category
- Article
- ISSN
- 0040-6090
No coin nor oath required. For personal study only.
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