Interaction of swift ion beams with surfaces: Sputtering of secondary ions from LiF studied by XY-TOF-SIMS

✍ Scribed by H. Hijazi; H. Rothard; P. Boduch; I. Alzaher; F. Ropars; A. Cassimi; J.M. Ramillon; T. Been; B. Ban d’Etat; H. Lebius; L.S. Farenzena; E.F. da Silveira

• Publisher: Elsevier Science
• Year: 2011
• Tongue: English
• Weight: 817 KB
• Volume: 269
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/j.nimb.2010.12.062